Loading Events

« All Events

  • This event has passed.

CRITIQUE RESIDENCY

April 17, 2015 - April 18, 2015

The Dayton Regional STEM School (DRSS) offers the April Residency as an opportunity to dive deeply into the instruction and use of critique practices in the classroom. This two-day professional development opportunity will focus on how Elementary through High School students can be taught explicitly to be kind, helpful, and specific when reviewing each others’ work through the Six Thinking Hats critique system, adapted based on Edward de Bono’s problem solving method of the same name. These strategies help students look critically at the work of others and themselves, assessing it for both content (utilizing classroom terminology to address learning targets) and construction (craftsmanship and professional execution). In the process, students also learn to be responsive to the emotional needs of their peers, and sensitive to others’ criticism in productive ways. Participants will learn the Thinking Hats through a series of critique activities that can be taken back to their respective classrooms, no matter the content area or grade level. Pat Murakami and Emerie Whitman-Allen, teachers of the STEM Foundations curriculum at DRSS, will lead the Residency.

The cost to attend the Residency has been reduced to $50!!! – this price includes lunch each day!

Graduate Credit is also available:  $250.00 for 1 semester hour.

TO REGISTER, PLEASE VISIT THE FOLLOWING LINK:  RESIDENCY REGISTRATION FORM

 

Venue

Dayton Regional STEM Training Center at the Dayton Regional STEM School
1724 Woodman Drive
Kettering, 45420 United States
+ Google Map
Phone:
(937) 256-3777
Next Page: